IEC 60352-3:2020 pdf download – Solderless connections – Part 3: Accessible insulation displacement (ID) connections – General requirements, test methods and practical guidance.
7.2.4 Repeated connection and disconnection, reusable accessible ID terminations The object of this test is to assess the ability of a reusable accessible ID termination to with- stand a specified number of connections and disconnections. Wherever the term “specified” is used in the following, it refers to either the relevant specifica- tions provided in an accompanying instruction sheet, or the detail product specification or – in lack of this – the manufacturer’s specification. In the following, all the information required to be provided for this test are duly underlined. A specified wire shall be inserted into a reusable accessible ID termination in a specified manner. Following this, the wire shall be extracted in a specified manner. This shall be con- sidered to be one cycle. The last cycle of a specified number of test cycles consists of only inserting the wire into the termination, i.e. in any case there shall be a complete ID connection at the end of a specified number of test cycles. The same reusable accessible ID termination shall be used for the total number of test cycles specified. A new part of the wire or a new wire of the same type shall be used for each test cycle. Where terminations are designed to accept a range of conductor sizes all cycles except the last one shall be carried out with the maximum conductor sizes specified. The last cycle and the final measurement shall be carried out with the minimum conductor sizes specified. Test severities: The conductor sizes for the last cycle and the number of cycles to be carried out shall be specified. Preferred values for the number of cycles are 4, 20 or 1 00.
7.3 Electrical tests 7.3.1 General The component detail product specification or the manufacturer’s specification shall prescribe the upper category temperature (UCT) and the lower category temperature (LCT) which shall be used in the following tests. NOTE 1 These temperatures, when the ID connections under test are employed in a connector, coincide with the ULT (upper limiting temperature) and LLT (lower limiting temperature) as defined in IEC 61 984 and declared in the connector’s detail product specification (IEC standard) or in the connector’s manufacturer specification. NOTE 2 A typical way of providing such information is the derating diagram as defined by test 5b of IEC 6051 2-5-2. NOTE 3 The current-carrying capacity of an ID connection can consist of a single ID termination in combination with a certain size of conductor for which the termination is suitable. However, in case of use of a multiple set of ID terminations in a component like a multipole connector, the current-carrying capacity under consideration is that of the fully wired and continuously loaded component. NOTE 4 The choice of the wire (cross-sectional area, sheathing) can limit the current-carrying capacity of the ID connection.
8 Test schedules 8.1 General 8.1.1 Overview Prior to testing, specimens shall be made. Each specimen shall consist of an accessible ID termination with a wire inserted. 8.1.2 ID connections with terminations suitable for a range of wire diameters When ID connections with terminations designed to be suitable for a range of wire diameters are to be tested the tests shall be carried out: a) with the number of specimens specified in Table 4 made with wires having the minimum conductor diameter within the range; and additionally b) with the number of specimens specified in Table 4 made with wires having the maximum conductor diameter within the range. 8.1.3 Multipole connectors When multipole connectors are to be tested the required number of specimens (ID connections) shall be evenly distributed over several components: Before the specimens are prepared, it shall be verified that: a) correct terminations and wires are used; b) the correct wire insertion tool is used; c) the tool works correctly; d) the operator is able to produce ID connections which comply with the prerequisites of 5.4.