IEEE Std 1505.3-2015 pdf download – IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505™ Receiver Fixture Interface Standard.
3. Definitions, acronyms, and abbreviations 3.1 Definitions For the purposes of this document, the following terms and definitions apply. The IEEE Standards Dictionary Online should be consulted for terms not defined in this clause. 5 combination framework: Represents IEEE Std 1505-2010 framework that combines segmented and continuous designs in a single tier interface. dual slot connector module: Is a two-slot wide IEEE Std 1505-2010 connector that applies a mixed pin configuration and applied to the Standard. open architecture: Describes the layered hierarchical structure, configuration, or model of a communications or distributed data processing that enables system description, design, development, installation, operation, improvement, purchase, and maintenance to be performed at a given layer or layers in the hierarchical structure without directly impacting another layer. plug-on cable interface: Is a cable assembly with quick-disconnect connector that for standard applications permits direct jackscrew interface to a receiver without a fixture framework. scalability: The ability to provide functionality either upward or downward in a graduated series.
4. Framework, connector and contact pin configuration 4.1 Architecture overview The term Receiver-Fixture Interface (RFI) describes the overall assembly that is used in electronic test applications. Mounted to various ATS benchtop/portable test system instrument configurations, (as described by Figure 1), the test interface provides a quick-disconnect mass termination between receiver/fixture electrical units. The receiver is typically hard-mounted to the benchtop/portable chassis and serves as the receptacle part of the test interface, which can be scaled to the test requirement pin configuration. The fixture is uniquely designed for a specific test program set (TPS) to adapt a unit-under- test (UUT) to the ATS. In any application of the RFI, the architecture performs the same function of quickly blind mating thousands of contacts and their related electrical signals with minimum effort and time.