UL 61215-1-1-2021 pdf download – Terrestrial Photovoltaic (PV) Modules – Design Qualification and Type Approval – Part 1-1: Special Requirements for Testing of Crystalline Silicon Photovoltaic (PV) Modules.
11.18 Bypass diode testing (MQT 18) This test of IEC 61215-2 is applicable without modifications. 11.19 Stabilization (MQT 19) This test of IEC 61215-2:2021 is applicable with the following modifications: 11.19.1 Criterion definition for stabilization For the definition of stabilization as per test MQT 19 of IEC 61215-2:2021, x = 0,01 shall be used for crystalline silicon PV modules. 11.19.2 Light induced stabilization procedures This test of IEC 61215-2:2021 is applicable without modifications. 11.19.3 Other stabilization procedures This test of IEC 61215-2:2021 is applicable without modifications. 11.19.4 Initial stabilization (MQT 19.1) Initial stabilization of c-Si modules shall be obtained by exposing all modules to sunlight (either real or simulated) to an irradiation dose level of ≥10 kWh/m 2 . After this preconditioning all of the test modules shall be measured for STC power (MQT 06.1). To fulfil MQT 19 requirements two intervals of at least 5 kWh/m 2 each are required. If stabilization is performed outdoors no module temperature limits apply. A validated alternative procedure can be used in accordance to MQT 19 of IEC 61215-2:2021 After module stabilization, the timeframe for the subsequent tests is not critical. Perform all measurements within a comparable timeframe and state time in report. 11.19.5 Final stabilization (MQT 19.2) Final stabilization (MQT 19.2) is not required, except for modules that have been tested according to MQT 21, Potential induced degradation test (in sequence F), or MQT 13, Damp heat test (in sequence E). Final stabilization requirements differ depending on whether the module has been subjected to MQT 13 or MQT 21. For modules that have been tested according to MQT 13, damp heat test (in sequence E), a choice of two final stabilization methods, “Method 1” or “Method 2”, is available: Method 1) • Perform MQT 19.3 as defined in IEC 61215-2. • Record choice of stabilization method 1) in the test report.
• Perform MQT 06.1 and evaluate the gate No. 2 formula defined in IEC 61215-1. • If the module passes gate No. 2, then final stabilization, MQT 06.1, and gate No. 2 are all complete. In the test report, record stabilization method 2, MQT 06.1 results, and the following text: “This module was not stabilized, and therefore the amount of degradation observed may be larger than what would have been obtained if the module had been stabilized, due to destabilization artifacts.” Proceed to the next step of the test flow defined in IEC 61215, which is MQT 03. • If the module does not pass gate No. 2, record the initial MQT 06.1 result, then perform each step of Method 1). For modules that have been tested according to MQT 21, PID (in sequence F) a choice of two final stabilization methods, “Method 3” or “Method 4”, is available: Method 3) • Modules shall be exposed to an irradiation of (2,0 ± 0,2) kWh/m 2 . • Exposure shall be performed as per IEC 61215-2:2021 MQT 10, with the temperature and spectrum meeting the requirements specified therein. Heat-up, exposure, and cool-down shall be performed such that the module spends less than 24 h above 40 °C. The only differences between the exposure in Method 3 and that in MQT 10 are the total dose, which side of the module is exposed, and the addition of a time limit. • For bifacial modules, the irradiance shall be applied to the rear side, whereas for monofacial modules, the irradiance shall be applied to the front side. • The class CCC solar simulator listed as required apparatus in MQT 19.2 shall fulfill the class C spectral requirements over at least the short-wavelength portion of the extended wavelength range described in IEC 60904-9.